Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Discharge current analysis with charged connector pins

 
: Tamminen, Pasi; Fung, Rita; Wong, Rick; Weber, Johannes; Wolf, Heinrich

:

Microelectronics reliability 115 (2020), Art. 113977, 12 S.
ISSN: 0026-2714
Englisch
Zeitschriftenaufsatz
Fraunhofer EMFT ()
ESD; CDM; CC-TLP; rise time; current slew rate

Abstract
Electrical connectors can get static charges during handling and discharge on a printed circuit board when assembled. The rise time and shape of the discharge current waveform is studied with simulation and measurement methods. Results show that the ESD current rise time can be less than 10 ps.

: http://publica.fraunhofer.de/dokumente/N-606017.html