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Inline Layer Thickness Measurement

Contactless measurement with terahertz waves in the micrometer to centimeter range
 
: Jonuscheit, Joachim

Kunststoffe international (2019), Nr.10, S.124-127
ISSN: 1862-4243
Englisch
Zeitschriftenaufsatz
Fraunhofer ITWM ()
terahertz inspection system; contactless measurement with terahertz waves; inline layer thickness measurement

Abstract
Terahertz technology supports contactless inline measurement in the micrometer to centimeter range. Wall thicknesses of pipes, hoses, and other extrusion products can be verified directly in the production process. Falling below the minimum thickness is identified immediately, thereby avoiding waste.

: http://publica.fraunhofer.de/dokumente/N-602444.html