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Comparison of Signal Processing Algorithms for High-Resolution FMCW Terahertz Thickness Measurements

: Schreiner, N.; Keil, A.; Sauer-Greff, W.; Urbansky, R.; Friederich, F.

Volltext ()

Institute of Physics -IOP-, London:
Smart Nanomaterials. Advances, Innovation and Applications, SNAIA 2019 : 10-13 December 2019, Paris, France
Bristol: IOP Publishing, 2020 (Journal of physics. Conference series 1537)
Art. 012018, 5 S.
Conference "Smart Nanomaterials - Advances, Innovation and Applications" (SNAIA) <2019, Paris>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ITWM ()

When using the frequency-modulated continuous-wave (FMCW) approach for layer thickness determination of dielectrics, such as multilayer pipe walls, the resolution is usually limited by the bandwidth. For thinner layers, we compare the measurement signal with potential model signal outputs. Since our approach results in high computation efforts by using brute force optimization, spectral estimation may present an alternative for high resolution distance and hence thickness determination. In this contribution, we compare results of a parametric algorithm (modified covariance method) and a subspace method (multiple signal classification, MUSIC) with the results of our approach.