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Spatial Identification of Dielectric Properties using Synthetic Aperture Radar

 
: Barowski, J.; Jebramcik, J.; Wagner, J.; Pohl, N.; Rolfes, I.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2019 : 16th - 18th July 2019, Bochum, Germany
Piscataway, NJ: IEEE, 2019
ISBN: 978-1-72810-936-7
ISBN: 978-1-72810-935-0
ISBN: 978-1-72810-937-4
S.139-141
International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) <2019, Bochum>
Englisch
Konferenzbeitrag
Fraunhofer FHR ()

Abstract
This contribution presents a methodology and a measurement setup for spatially resolved material characterization. For this purpose, calibrated millimeter-wave (mmWave) frequency modulated continuous wave (FMCW) radar systems, operating up to 250 GHz, are utilized. The calibration scheme allows for a systematic error correction comparable to a vector network analyzer (VNA). A synthetic aperture radar (SAR) measurement is used to generate a focused 3-dimensional image with very high resolution. A precise spatial distribution of the material parameters is obtained by a novel combination of the imaging and material parameter extraction algorithms.

: http://publica.fraunhofer.de/dokumente/N-585551.html