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Unravelling the Origins of Contact Recombination for Localized Laser-Doped Contacts

 
: Ernst, M.; Huyeng, J.D.; Walter, D.; Fong, K.C.; Blakers, A.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 : A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC, 10-15 June 2018, Waikoloa Village, HI, USA
Piscataway, NJ: IEEE, 2018
ISBN: 978-1-5386-8529-7
ISBN: 978-1-5386-8530-3
S.2195-2199
World Conference on Photovoltaic Energy Conversion (WCPEC) <7, 2018, Waikoloa/Hawaii>
Photovoltaic Specialists Conference (PVSC) <45, 2018, Waikoloa/Hawaii>
Photovoltaic Science and Engineering Conference (PVSEC) <28, 2018, Waikoloa/Hawaii>
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <34, 2018, Waikoloa/Hawaii>
Englisch
Konferenzbeitrag
Fraunhofer ISE ()

Abstract
Both localized laser-doping and contact opening are utilized in fabrication of high-efficiency solar cell devices. In this work, we present an experimental method to separate the origins of the lumped recombination parameter for localized contacts. We attribute the main source of recombination after laser doping to small edges around the laser-processed regions (j 0,e Ĭ 10,000 fA/cm 2 ), while the center areas have a non-negligible contribution (j 0,a ≈ 2,000-3,000 fA/cm 2 ). Both contributions can be significantly reduced by annealing. At the same time, the nonoptimized laser process achieves contact resistivity values as low as 70 μΩ cm 2 .

: http://publica.fraunhofer.de/dokumente/N-581509.html