Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Physical and technical basics
| Breitenstein, O.; Warta, W.; Schubert, M.C.:
Lock-in Thermography. Third edition : Basics and use for evaluating electronic devices and materials
Cham: Springer Nature, 2018 (Springer Series in Advanced Microelectronics 10)
ISBN: 978-3-319-99824-4 (Print)
ISBN: 978-3-319-99825-1 (Online)
DOI: 10.1007/978-3-319-99825-1
S.7-62 |
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| Englisch |
| Aufsatz in Buch |
| Fraunhofer ISE () |
Abstract
First, in Sect. 2.1 the general basics of infrared (IR) thermography are briefly reviewed, which are also applicable to IR camera based lock-in thermography. In Sect. 2.2, the principles of the lock-in technique itself and of its digital realization are described.