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Physical and technical basics

 
: Breitenstein, O.; Warta, W.; Schubert, M.C.

:

Breitenstein, O.; Warta, W.; Schubert, M.C.:
Lock-in Thermography. Third edition : Basics and use for evaluating electronic devices and materials
Cham: Springer Nature, 2018 (Springer Series in Advanced Microelectronics 10)
ISBN: 978-3-319-99824-4 (Print)
ISBN: 978-3-319-99825-1 (Online)
DOI: 10.1007/978-3-319-99825-1
S.7-62
Englisch
Aufsatz in Buch
Fraunhofer ISE ()

Abstract
First, in Sect. 2.1 the general basics of infrared (IR) thermography are briefly reviewed, which are also applicable to IR camera based lock-in thermography. In Sect. 2.2, the principles of the lock-in technique itself and of its digital realization are described.

: http://publica.fraunhofer.de/dokumente/N-581378.html