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 Breitenstein, O.; Warta, W.; Schubert, M.C.: Lockin Thermography. Third edition : Basics and use for evaluating electronic devices and materials Cham: Springer Nature, 2018 (Springer Series in Advanced Microelectronics 10) ISBN: 9783319998244 (Print) ISBN: 9783319998251 (Online) DOI: 10.1007/9783319998251 S.101148 

 Englisch 
 Aufsatz in Buch 
 Fraunhofer ISE () 
Abstract
The following sections will outline the heat diffusion theory underlying lockin thermography experiments. First, in Sect. 4.1, the effects of the heat conduction on the surrounding of the sample will be discussed, presenting the definitions of a thermally thin and a thermally thick sample, and of the quasiadiabatic state of a measurement. In Sect. 4.2, a simple method is being introduced of compensating the temperature drift in the initial heatingup phase of lockin thermography experiments. These considerations should also be of interest when interpreting nondestructive testing experiments. Then, the following two sections will review the theory of the propagation of thermal waves for different heat source geometries. Based on these results, in Sect. 4.5 follows a summary of the most important relations for the quantitative interpretation of lockin thermography measurements in terms of power sources for simple heat source geometries. In Sect. 4.5.1, the image integration/proportionality method is being introduced, which allows a quantitative interpretation of lockin thermography results also for an arbitrary distribution of heat sources. Finally, Sect. 4.5.2 describes recent advances in the softwarebased correction of the effect of the lateral heat conduction within the sample on lockin thermograms, implying also a quantitative interpretation of lockin thermography results.