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Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering

 
: Herms, M.; Irmer, G.; Verma, P.; Goerigk, G.

:

Geer, R.E. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Testing, reliability, and application of micro- and nano-material systems III : Proceedings of the Third Conference on Testing, Reliability, and Application of Micro- and Nano-Material Systems; 8 - 10 March 2005, San Diego, California, USA
Bellingham/Wash.: SPIE, 2005 (SPIE Proceedings Series 5766)
ISBN: 0-8194-5747-7
S.32-39
Conference on Testing, Reliability, and Application of Micro- and Nano-Material Systems <3, 2005, San Diego/Calif.>
Englisch
Konferenzbeitrag
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

Abstract
Laser spectroscopical methods as Raman scattering (RS) and Photoluminescence as well as Small Angle Scattering of Xrays (SAXS) are presented as powerful tools for the efficient, nondestructive and contact-less characterization of nanoparticles of low concentration (< 1% in volume) in solids in dependence on the history of thermal treatment. The complementary determination of size distribution of CdSxSe1-x nanocrystallites in silicate glass filters and of arsenic precipitates in low-temperature grown GaAs layers by RS and SAXS is exemplarily presented.

: http://publica.fraunhofer.de/dokumente/N-57593.html