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Determining the waveguide profile using the overlap integral

: Alberucci, A.; Jisha, C.P.; Nolte, S.


Institute of Electrical and Electronics Engineers -IEEE-:
Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 : 23-27 June 2019, Munich, Germany
Piscataway, NJ: IEEE, 2019
ISBN: 978-1-7281-0469-0
ISBN: 978-1-7281-0470-6
Conference on Lasers and Electro-Optics Europe (CLEO Europe) <2019, Munich>
European Quantum Electronics Conference (EQEC) <2019, Munich>
Fraunhofer IOF ()

The determination of the index profile in guiding structures is a central problem in applied photonics, ranging from optical fibers to femtosecond-written waveguides [1]. A non-destructive and relatively easy method consists in the measurement of the index profile by measuring the transmitted field [2]. From the transmitted field, the refractive index profile is computed by direct inversion of the Helmholtz equation. This technique is called near-field method. Here we present a new near-field method based upon the inversion of the overlap integral.