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Single event effects by atmospheric neutrons in commercial (COTS) normally-off GaN HEMT

Poster presented at 30th European Conference on Radiation and its Effects on Components and Systems, RADECS 2019, Montpellier, France, September 16-20, 2019
 
: Wölk, Dorothea; Höffgen, Stefan; Paschkowski, Eike; Steffens, Michael; Cazzaniga, Carlo; Frost, Christopher D.

:
Poster urn:nbn:de:0011-n-5744968 (718 KByte PDF)
MD5 Fingerprint: 71110d7be9a583d8a7fa7a01ee5cadb2
Erstellt am: 28.1.2020


2019, 1 Folie
European Conference on Radiation and its Effects on Components and Systems (RADECS) <30, 2019, Montpellier>
Englisch
Poster, Elektronische Publikation
Fraunhofer INT ()
SEE; GaN; HEMT; COTS; neutrons; atmospheric

Abstract
Results of SEE testing of commercial high power normally-off GaN-devices with an atmospheric-like neutron spectrum at ChipIR are presented. Three different designs of GaN-HEMTs and one SiC-MOSFET were tested at different voltages and the cross sections were determined.

: http://publica.fraunhofer.de/dokumente/N-574496.html