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A reference test setup to support research and development of HPEM testing schemes

 
: Pusch, Thorsten; Willenbockel, Martin; Hurtig, Tomas; Suhrke, Michael; Ruge, Sven; Jörres, Benjamin; Jöster, Michael

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Institute of Electrical and Electronics Engineers -IEEE-:
International Symposium on Electromagnetic Compatibility, EMC Europe 2019 : September 2-6, 2019, Barcelona
Piscataway, NJ: IEEE, 2019
ISBN: 978-1-7281-0594-9
ISBN: 978-1-7281-0593-2
ISBN: 978-1-7281-0595-6
S.686-690
International Symposium on Electromagnetic Compatibility (EMC Europe) <2019, Barcelona>
Englisch
Konferenzbeitrag
Fraunhofer INT ()
HPEM; immunity testing; test method; reference setup; standard development; measurement uncertainty

Abstract
As an extension to EMC testing procedures covering regulated exposure conditions, schemes for probing immunity of electronic devices against high power electromagnetics (HPEM) have been developed and refined over the years. Several test environments are available, some not yet fully acknowledged in standard documents or laboratory practice. In order to further their development and to facilitate exchange across laboratories and methods, a new reference test setup representing a modern, generic IT system has been designed. Fixed on a styrofoam board, a small single board computer is complemented with digital and analogue periphery. The affordable hardware, compact footprint and battery operation invite for implementation in a variety of use cases. A custom monitoring software visualizes well-defined error conditions under exposure as signaled via optical link. The setup will be detailed together with test results garnered with monofrequent pulsed RF signals between 1 and 2 GHz, showing good reproducibility of a diverse range of error types.

: http://publica.fraunhofer.de/dokumente/N-569002.html