Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

IEMI resilience assessment of critical infrastructures

 
: Pusch, Thorsten; Lanzrath, Marian; Suhrke, Michael

:

Institute of Electrical and Electronics Engineers -IEEE-:
International Symposium on Electromagnetic Compatibility, EMC Europe 2019 : September 2-6, 2019, Barcelona
Piscataway, NJ: IEEE, 2019
ISBN: 978-1-7281-0594-9
ISBN: 978-1-7281-0593-2
ISBN: 978-1-7281-0595-6
S.1132-1137
International Symposium on Electromagnetic Compatibility (EMC Europe) <2019, Barcelona>
European Commission EC
H2020; 700621; SmartResilience
Smart Resilience Indicators for Smart Critical Infrastructures
Englisch
Konferenzbeitrag
Fraunhofer INT ()
IEMI; HPEM; resilience assessment; risk analysis; critical Infrastructures

Abstract
Addressing EMC issues beyond legal exposure limits, the term of intentional electromagnetic interference (IEMI) designates deliberate attempts to disrupt normal operation of electronics, from single devices up to large systems like critical infrastructures sustaining fundamental processes in society. When trying to assess the overall vulnerability of the latter and prioritising resources for protective measures, investigating the technical aspects of system susceptibility will have to be complemented with broader, interdisciplinary methodology for risk management or resilience assessment. Acknowledging approaches already suggested within the field of EMC, we discuss the concept of resilience scoring based on indicators as elaborated within the EU project SmartResilience. Among hundreds of indicators, a dozen evaluation prescriptions are included in the project database pertaining to the IEMI threat. After outlining the general project methodology, an exemplary assessment of a generic power grid substation is discussed in comparison with other approaches. While using accessible indicators enables easily performed assessments and thus scales even to large, distributed systems, more depth is achieved by the focused methods in turn requiring extensive efforts by experts.

: http://publica.fraunhofer.de/dokumente/N-569001.html