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Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems

 
: Schwarz, Bastian; Körber, Michael; Ritt, Gunnar; Eberle, Bernd

:

Titterton, D.H. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Technologies for Optical Countermeasures XVI : 10-11 September 2019, Strasbourg, France
Bellingham, WA: SPIE, 2019 (Proceedings of SPIE 11161)
ISBN: 978-1-5106-3025-3
ISBN: 978-1-5106-3026-0
Paper 111610A, 14 S.
Conference "Technologies for Optical Countermeasures" <16, 2019, Strasbourg>
Englisch
Konferenzbeitrag
Fraunhofer IOSB ()
laser-induced damage threshold; charge-coupled device camera; complementary metal-oxide-semiconductor camera; digital micromirror device

Abstract
Based on our previous work1, we further investigate the laser-induced damage effects on digital micromirror devices (DMD) in comparison to different electro-optical imaging sensors such as complementary metal-oxide-semiconductors (CMOS) and charge-coupled devices (CCD). In our earlier work, we reported on damage thresholds obtained by pulsed laser radiation of nanosecond pulse width and by continuous-wave laser radiation utilizing irradiation times ranging from 250 milliseconds up to 10 seconds. The main objective of our current work is to fill the gap regarding the time scale of picosecond pulses. In the course of this research, we enhanced the experimental setup and we explicitly describe the achieved improvements in this work. Furthermore, we characterize the damage caused by laser pulse energies exceeding the laser-induced damage threshold (LIDT).

: http://publica.fraunhofer.de/dokumente/N-565097.html