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HMX crystal topography investigated by means of atomic force microscopy and confocal microscopy

: Herrmann, Michael; Weyrauch, Hubert

Volltext urn:nbn:de:0011-n-5647763 (1.7 MByte PDF)
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Erstellt am: 9.11.2019

Fraunhofer-Institut für Chemische Technologie -ICT-, Pfinztal:
Energetic materials. Past, present and future : 50th International Annual Conference of the Fraunhofer ICT, June 25-28, 2019, Convention Center, Karlsruhe, Germany
Pfinztal: Fraunhofer ICT, 2019
14 S.
Fraunhofer-Institut für Chemische Technologie (International Annual Conference) <50, 2019, Karlsruhe>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ICT ()

The surface morphology of HMX grades (euhedral and subhedral) was investigated by means of atomic force microscopy and confocal microscopy. The crystals revealed quite different topographic structures, including step-shaped surfaces, outgrowths from the crystal bulk, fine particles intergrown to the bulk, surface roughness and in case of a type B grade HMX a highly defective surface layer. Stochastic methods were applied to quantify surface parameters such as the density and mean height of outgrowths/particles and the mean depth of the porous surface layer.