Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Fundamentals for IoT Testing

Presentation held at Congreso Internacional Cibersociedad 2019, 14 y el 18 de octubre de 2019, Varadero
 
: Hackel, Sascha; Rennoch, Axel

:
Präsentation urn:nbn:de:0011-n-5618384 (2.2 MByte PDF)
MD5 Fingerprint: 0c46b8313af84b7571ec5969670febef
Erstellt am: 23.10.2019


2019, 28 Folien
Congreso Internacional Cibersociedad (CS) <2019, Varadero>
Bundesministerium fur Wirtschaft und Energie BMWi (Deutschland)

Smart Service Welt 1
Englisch
Vortrag, Elektronische Publikation
Fraunhofer FOKUS ()
test automation; IoT; TTCN-3

Abstract
In IoT, quality engineering faces new challenges. For example, the system under test (SUT) vary from single IoT devices to highly dynamic IoT infrastructures and platforms. Consequently, test design techniques have to be able to deal with a high number of devices with open interfaces. Those devices are sensors, actuators, microcontrollers or gateways. Sometimes they are installed in harsh and unreliable environments. Primarily, devices like sensors and microcontrollers work under resource constrained conditions such as energy supply or network availability. Functional and non-functional aspects play an important role and need to be considered.

: http://publica.fraunhofer.de/dokumente/N-561838.html