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Status of the next generation CMOS-TDI detector for high-resolution imaging

: Eckardt, Andreas; Gläsener, Stefan; Reulke, Ralf; Sengebusch, Karsten; Zender, Bernd


Butler, James J. (Hrsg.) ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Earth Observing Systems XXIV : 11-15 August 2019; San Diego, California, United States
Bellingham, WA: SPIE, 2019 (Proceedings of SPIE 11127)
Paper 111270J, 9 S.
Conference "Earth Observing Systems" <24, 2019, San Diego/Calif.>
Fraunhofer IMS ()
visible and near-infrared (VNIR); positive temperature coefficient (PTC); new detector architecture; detector control electronics

The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 35 years of experience with high-resolution imaging technology. This paper shows the institutes scientific results of the next generation of CMOS detector design in a TDI (Time Delay and Integration) architecture. This project includes the technological design of future high or multispectral resolution space-borne instruments and the possibility of higher integration. First results where published by Eckardt, et al. (1 ) 2013 and (2 ) 2014. DLR OS and the Fraunhofer Institute for Microelectronic Circuits and Systems in Duisburg were driving the technology of new detectors for future high resolution projects and hybridization capability in order to keep pace with the ambitious scientific and user requirements. In combination with the engineering research, the current generation of space borne sensor systems is focusing on VIS/NIR high spectral resolution to meet the requirements on earth and planetary observation systems. The combination of large swath and high-spectral resolution with intelligent synchronization control, fast-readout ADC chains and new focal-plane concepts open the door to new remote-sensing and smart deep-space instruments. The paper gives an overview over the DLR detector development and verification program on FPA level. New control possibilities for CMOS-TDI NG detectors in synchronization control mode, and key parameters like linearity, PTC, cross talk and control effort will be discussed in detail.