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Light scattering techniques for the characterization of optical components

: Hauptvogel, M.; Schröder, S.; Herffurth, T.; Trost, M.; Finck, A. von; Duparré, A.; Weigel, T.


Sodnik, Zodan (ed.) ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
International Conference on Space Optics, ICSO 2014 : 6-10 October 2014, Tenerife, Canary Islands, Spain
Bellingham, WA: SPIE, 2017 (Proceedings of SPIE 10563)
Art.1056347, 8 S.
International Conference on Space Optics (ICSO) <10, 2014, La Caleta/Tenerife>
Fraunhofer IOF ()

The rapid developments in optical technologies generate increasingly higher and sometimes completely new demands on the quality of materials, surfaces, components, and systems. Examples for such driving applications are the steadily shrinking feature sizes in semiconductor lithography, nanostructured functional surfaces for consumer optics, and advanced optical systems for astronomy and space applications. The reduction of surface defects as well as the minimization of roughness and other scatter-relevant irregularities are essential factors in all these areas of application. Quality-monitoring for analysing and improving those properties must ensure that even minimal defects and roughness values can be detected reliably. Light scattering methods have a high potential for a non-contact, rapid, efficient, and sensitive determination of roughness, surface structures, and defects.