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Scanning electrochemical microscopy: An analytical perspective

: Izquierdo, Javier; Knittel, Peter; Kranz, Christine


Analytical and bioanalytical chemistry 410 (2018), Nr.2, S.307-324
ISSN: 1618-2642 (Print)
ISSN: 1618-2650 (Online)
Fraunhofer IAF ()
scanning electrochemical microscopy (SECM); nanoelectrode; analytical figures of merit; method validation

Scanning electrochemical microscopy (SECM) has evolved from an electrochemical specialist tool to a broadly used electroanalytical surface technique, which has experienced exciting developments for nanoscale electrochemical studies in recent years. Several companies now offer commercial instruments, and SECM has been used in a broad range of applications. SECM research is frequently interdisciplinary bridging areas ranging from electrochemistry, nanotechnology, and materials science to biomedical research. Although SECM is considered a modern electroanalytical technique, it appears that less attention is paid to so-called analytical figures of merit, which are essential also in electroanalytical chemistry. Besides instrumental developments, this review focuses on aspects such as reliability, repeatability, and reproducibility of SECM data. The review is intended to spark discussion within the community on this topic, but also to raise awareness of the challenges faced during the evaluation of quantitative SECM data.