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Compact echelle spectrometer employing a cross-grating

: Thomae, D.; Hönle, T.; Kraus, M.; Bagusat, V.; Deparnay, A.; Brüning, R.; Brunner, R.

Volltext ()

Applied optics 57 (2018), Nr.25, S.7109-7116
ISSN: 0003-6935
ISSN: 1539-4522
ISSN: 1559-128X
Zeitschriftenaufsatz, Elektronische Publikation
Fraunhofer IOF ()

The concept and the implementation of a compact and simplified echelle spectrometer are presented, and the working principle is demonstrated by first experimental measurements. The crucial element of the setup is a cross-grating, combining an echelle grating utilizing several higher diffraction orders (5th up to 11th) and a superposed perpendicular-oriented cross-dispersing grating. Two alternative manufacturing approaches for the cross-grating are presented and discussed. The first approach combines Talbot lithography for the deep echelle grating and interference lithography for the cross-dispersing structure. As a second approach, direct laser-beam writing was applied. The compact echelle spectrometer covers a spectral range from 380 to 700 nm and offers a spectral resolution of ∼2  nm.