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Detectability in the SWIR spectral range

 
: Winkelmann, Max

:

Stein, K.U. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Target and Background Signatures IV : 10-13 September 2018, Berlin, Germany
Bellingham, WA: SPIE, 2018 (Proceedings of SPIE 10794)
Paper 1079403, 8 S.
Conference "Target and Background Signatures" <4, 2018, Berlin>
Englisch
Konferenzbeitrag
Fraunhofer IOSB ()

Abstract
Analysis of detectability in the short-wave infrared spectral regions shows the sensitivity of this imagery towards illumination conditions and different spectral regions. It will be described how difficult the assessment of camouflage materials can be.

: http://publica.fraunhofer.de/dokumente/N-521355.html