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A new state model for DRAMs using Petri Nets

: Jung, M.; Kraft, K.; Wehn, N.


Patt, Yale (Hrsg.) ; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Circuits and Systems Society:
International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, SAMOS XVII 2017. Proceedings : July 16-20, 2017, Samos, Greece
Piscataway, NJ: IEEE, 2017
ISBN: 978-1-5386-3437-0
ISBN: 978-1-5386-3438-7
International Conference on Embedded Computer Systems - Architectures, Modeling, and Simulation (SAMOS) <17, 2017, Samos>
Fraunhofer IESE ()

The functionality of DRAMs, especially the state transitions are described in JEDEC standards. These standards contain a finite state machine, which intends to provide an overview of the possible state transitions and the commands to control them. However, today's DRAMs are highly concurrent devices as they provide bank parallelism. The state diagram used in JEDEC standards does not model this concurrency and furthermore it is misleading in several aspects. In this paper, for the first time we present an easily comprehensive model of the DRAM states and transitions, using a Petri Net, which covers also the DRAM concurrency.