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Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples. Numerical investigation

Poster presented at ESREF 2018, 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Aalborg, Denmark, October 1-5, 2018
 
: Simon, Flaviu-Bogdan

:
Poster urn:nbn:de:0011-n-5153295 (1.0 MByte PDF)
MD5 Fingerprint: 1c9431d409f088ee605c0a2b3a4074c9
Erstellt am: 23.10.2018


2018, 1 Folie
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) <29, 2018, Aalborg>
Englisch
Poster, Elektronische Publikation
Fraunhofer IISB ()

: http://publica.fraunhofer.de/dokumente/N-515329.html