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ESD robustness of IoT devices: Are we going to face new challenges?

Presentation held at EOS/ESD Symposium, Workshop on Robustness of IoT Devices, September 26-27, 2018, Reno, NV
 
: Wolf, Heinrich

:
Präsentation urn:nbn:de:0011-n-5151711 (2.0 MByte PDF)
MD5 Fingerprint: d9eda0b537c5ed2125b6e3fb048118d2
Erstellt am: 16.10.2018


2018, 29 Folien
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) <40, 2018, Reno/Nev.>
Workshop on Robustness of IoT Devices <2018, Reno/Nev.>
Englisch
Vortrag, Elektronische Publikation
Fraunhofer EMFT ()
ESD; robustness; IoT device

Abstract
The Internet of Things (IoT) is a rapidly growing market. Depending on the application the environmental conditions can be completely different for IoT devices. Furthermore, the growing complexity of these devices increase also the susceptibility concerning hardware or software related failures. This presentation will discuss real world examples which required more than the standard qualification tests in order to reveal and fix weaknesses in the design.

: http://publica.fraunhofer.de/dokumente/N-515171.html