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Subwavelength ripple formation induced by tightly focused femtosecond laser radiation

: Wagner, R.; Gottmann, J.; Horn, A.; Kreutz, E.W.


Applied surface science 252 (2006), Nr.24, S.8576-8579
ISSN: 0169-4332
Fraunhofer ILT ()

Subwavelength ripples (< lambda/4) are obtained by scanning a tightly focused beam (about 1 µm) of femtosecond laser radiation (lambda = 800 nm, t(ind p) = 100 fs) over the surface of either bulk fused silica and silicon and Er:BaTiO3. The ripple pattern extends coherently over many overlapping laser pulses parallel and perpendicular to the polarisation. Investigated are the dependence of the ripple spacing on the spacing of successive pulses, the direction of polarisation and the material. The evolution of the ripples is investigated by applying pulse bursts with N = 1 to 20 pulses. The conditions under which these phenomena occur are specified, and some possible mechanisms of ripple growth are discussed. Potential applications are presented.