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Perfect X-ray focusing via fitting corrective glasses to aberrated optics

: Seiboth, F.; Schropp, A.; Scholz, M.; Wittwer, F.; Rödel, C.; Wünsche, M.; Ullsperger, T.; Nolte, S.; Rahomäki, J.; Parfeniukas, K.; Giakoumidis, S.; Vogt, U.; Wagner, U.; Rau, C.; Boesenberg, U.; Garrevoet, J.; Falkenberg, G.; Galtier, E.C.; Lee, H.J.; Nagler, B.; Schroer, C.G.

Volltext ()

Nature Communications 8 (2017), Art.14623, 5 S.
ISSN: 2041-1723
Zeitschriftenaufsatz, Elektronische Publikation
Fraunhofer IOF ()

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.