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Pulse robustness of AlGaN/GaN HEMTs with Schottky- and MIS-gates

 
: Unger, Christian; Mocanu, Mariana; Pfost, Martin; Waltereit, Patrick; Reiner, Richard

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society:
ISPDS 2017, 29th International Symposium on Power Semiconductor Devices & ICs. Proceedings : May 28-June 1, 2017, Royton Sapporo, Sapporo, Japan
Piscataway, NJ: IEEE, 2017
ISBN: 978-4-88686-096-5
ISBN: 978-4-88686-094-1
ISBN: 978-4-88686-095-8
ISBN: 978-1-5090-5172-4
S.451-454
International Symposium on Power Semiconductor Devices and ICs (ISPDS) <29, 2017, Sapporo>
Englisch
Konferenzbeitrag
Fraunhofer IAF ()

Abstract
In this work we investigate the behavior of MIS-and Schottky-gate AlGaN/GaN HEMTs under high-power pulsestress. A special setup capable of applying pulses of constant power is used to evaluate the electro-thermal response in different operating points. For both types of devices, the time to failure was found to decrease with increasing drain-source voltage. Overall, the Schottky-gate device displays a higher pulse robustness. The pulse withstand time of the MIS-gate device is limited by the occurrence of a thermal instability at approximately 240 ◦C while the Schottky-gate device displays a rapid increase of the gate leakage current prior to failure. The mechanism responsible for this gate current is further investigated by static and transient temperature measurements and yielded activation energies of 0.6 eV and 0.84 eV.

: http://publica.fraunhofer.de/dokumente/N-502767.html