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Wavelength dependency of optical 3D measurements at translucent objects using fringe pattern projection

: Zhang, C.; Rosenberger, M.; Breitbarth, A.; Notni, G.


Harding, K.G. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Dimensional Optical Metrology and Inspection for Practical Applications VI : 13 April 2017, Anaheim, California, United States
Bellingham, WA: SPIE, 2017 (Proceedings of SPIE 10220)
ISBN: 978-1-5106-0941-9
ISBN: 978-1-5106-0942-6
Art. 1022007, 8 S.
Conference "Dimensional Optical Metrology and Inspection for Practical Applications" <6, 2017, Anaheim/Calif.>
Fraunhofer IOF ()

The requirement for a non-transparent Lambertian like surface in optical 3D measurements with fringe pattern projection cannot be satisfied at translucent objects. The translucency causes artifacts and systematic errors in the pattern decoding, which could lead to measurement errors and a decrease of measurement stability. In this work, the influence of light wavelength on 3D measurements was investigated at a stereoscopic system consisting of two filter wheel cameras with narrowband bandpass filters and a projector with a wide-band light source. The experimental results show a significant wavelength dependency of the systematic measurement deviation and the measurement stability.