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Light scattering characterization of optical components for space applications

: Hauptvogel, M.; Trost, M.; Costille, A.; Penka, D.; Zeitner, U.D.; Schröder, S.; Duparré, A.


Cugny, B. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
International Conference on Space Optics, ICSO 2016 : 18-21 October 2016, Biarritz, France
Bellingham, WA: SPIE, 2017 (Proceedings of SPIE 10562)
ISBN: 978-1-5106-1613-4
Art. 1056213, 8 S.
International Conference on Space Optics (ICSO) <2016, Biarritz>
Fraunhofer IOF ()

Light scattering can critically affect the performance of high-end optical systems. For instance, unavoidable but small residual imperfections of optical components such as surface or coating roughness, bulk inhomogeneities, and defects as well as the interaction of light with apertures and baffles give rise to light scattering propagating through the optical system which degrades the imaging quality and leads to a loss of the optical throughput.