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RF characterization of coplanar waveguide (CPW) transmission lines on single-crystalline diamond platform for integrated high power RF electronic systems

: He, Y.; Becker, M.; Grotjohn, T.; Hardy, A.; Muehle, M.; Schuelke, T.; Papapolymerou, J.


Shiroma, W. (Ed.) ; Institute of Electrical and Electronics Engineers -IEEE-:
IEEE MTT-S International Microwave Symposium, IMS 2017 : 06-08 Juni 2017, Honolulu, Hawaii
Piscataway, NJ: IEEE, 2017
ISBN: 978-1-5090-6360-4
ISBN: 978-1-5090-6361-1
International Microwave Symposium (IMS) <2017, Honolulu/Hawaii>
Fraunhofer CCD ()

This paper presents the fabrication process of single-crystalline diamond platform used for high power RF components. We report-for the first time to the best of our knowledge-results of a Coplanar Waveguide (CPW) transmission line printed on the single-crystalline diamond substrate using the Aerosol Jet Printing technique. The transmission line is 2.44 mm long and is printed on the 3.5 mm × 3.5 mm × 0.3 mm diamond substrate utilizing a silver ink as the conducting material. The characteristic impedance of the CPW line is designed to be 50 Ω. The measured average loss per millimeter of the line is 0.28 dB/mm and 0.46 dB/mm at 20 GHz and 40 GHz, respectively. This results show the single-crystalline diamond substrate is a good candidate for the development of highly integrated RF circuits.