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: Stolfi, A.; Chiffre, L. de; Kasperl, S.

:

Carmignato, S.:
Industrial X-Ray Computed Tomography
Cham: Springer International Publishing, 2017
ISBN: 978-3-319-59573-3
ISBN: 978-3-319-59571-9
S.143-184
Englisch
Aufsatz in Buch
Fraunhofer IIS ()

Abstract
In this chapter, an identification and classification of influence factors in X-ray computed tomography metrology is given. A description of image artefacts commonly encountered in industrial X-ray computed tomography is presented together with their quantification. A survey of hardware and software methods developed for correcting image artefacts is presented.

: http://publica.fraunhofer.de/dokumente/N-502360.html