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Reliability investigation on SiC based diode and MOSFET modules developed for high power conversion in medical X-ray applications

: Otto, A.; Dudek, R.; Rzepka, S.; Abo Ras, M.; Essen, T. von; Bast, M.; Hindel, A.; Eisele, R.; Mueter, U.; Lunding, A.

MESAGO PCIM GmbH, Stuttgart:
PCIM Europe 2017, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. Proceedings : Nuremberg, 16 - 18 May 2017
Berlin: VDE Verlag, 2017
ISBN: 978-3-8007-4424-4
PCIM Europe <2017, Nuremberg>
Fraunhofer ENAS ()

For the sake of compactness and mass reduction, the high power converter modules for x-ray generators in medical applications have been developed utilizing novel SiC diodes and SiC MOSFETs for the first time. The paper discusses the results of comprehensive investigations on the thermal per-formance as well as on the reliability of these modules - as found by power cycling tests supplemented by electro-thermo-mechanical simulations.