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Light beam induced current of light-induced degradation in high-performance multicrystalline Al-BSF cells

: Lindroos, J.; Petter, K.; Sporleder, K.; Turek, M.; Pacho, P.; Rinio, M.

Volltext ()

Energy Procedia 124 (2017), S.99-106
ISSN: 1876-6102
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) <7, 2017, Freiburg>
Konferenzbeitrag, Zeitschriftenaufsatz, Elektronische Publikation
Fraunhofer CSP ()

Multicrystalline silicon solar cells are plagued by different types of light-induced degradation (LID), including Sponge-LID. Sponge-LID decreases the Al-BSF cell efficiency by up to 10 %rel. and is only partially recoverable at 200°C. This contribution shows that Sponge-LID occurs at and near most grain boundaries, but only in the centre of the affected cell. Furthermore, Sponge-LID is not the only type of LID in the silicon bulk. High-resolution Light Beam Induced Current mapping reveals local internal quantum efficiency losses of up to 8 %rel. at dislocation clusters and small angle grain boundaries, which recover (nearly) fully at 200°C. Nevertheless, this dislocation-related LID appears to reduce the Al-BSF efficiency by less than 1 %rel.