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Determination of Crystal Grain Orientations by Optical Microscopy at Textured Surfaces and Application

 
: Lausch, D.; Gläser, M.; Hagendorf, C.

:

Bokhoven, T.P. ; European Commission:
29th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2014 : Proceedings of the international conference held in Amsterdam, The Netherlands, 22 - 26 September 2014, DVD
München: WIP, 2014
ISBN: 3-936338-34-5
S.567-572
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <29, 2014, Amsterdam>
Englisch
Konferenzbeitrag
Fraunhofer IWM ( IMWS) ()

Abstract
In this contribution the method to determine the crystal orientation with the example of chemical treated silicon wafers by means of optical microscopy recently introduced will be reviewed. The procedure represents an easy method to obtain all relevant parameters to describe the crystal structure of the investigated material i.e. the crystal grain orientation and the grain boundary character. The chemical treatment is a standard mono-texture for solar cells well known in the solar industry. In general, this concept can also be applied to other crystalline materials, i.e. GaAs, SiC etc., the only thing that needs to be adjusted is the texturing method to reveal specific crystal planes and the calculation model. An application of this method will be shown with the example of the defect classification of recombination active defects in mc-Si solar cell. The method combined with the shown application demonstrates a simple and quick opportunity to improve the crystallization process and the quality of electronic devices by means of an optical microscope and a chemical treatment of the material.

: http://publica.fraunhofer.de/dokumente/N-473440.html