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A novel approach for automatic common-centroid pattern generation

 
: Borisov, Vadim; Lange, Kerstin; Scheible, Jürgen; Prautsch, Benjamin

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PRIME 2017, 13th Conference on Ph.D. Research in Microelectronics and Electronics. Conference proceedings : 12th - 15th of June 2017, Giardini Naxos - Taormina, Italy; 14th International Conference on Synthesis, Modeling, Analysis, and Simulation Methods and Applications to Circuit Design, SMACD 2017
Piscataway, NJ: IEEE, 2017
ISBN: 978-1-5090-5051-2
ISBN: 978-1-5090-6507-3
ISBN: 978-1-5090-6508-0
ISBN: 978-1-5090-6509-7 (Print)
S.113-116
Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) <13, 2017, Taormina>
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) <14, 2017, Taormina>
Englisch
Konferenzbeitrag
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

Abstract
This paper introduces a novel placement methodology for a common-centroid (CC) pattern generator. It can be applied to various integrated circuit (IC) elements, such as transistors, capacitors, diodes, and resistors. The proposed method consists of a constructive algorithm which generates an initial, close to the optimum, solution, and an iterative algorithm which is used subsequently, if the output of constructive algorithm does not satisfy the desired criteria. The outcome of this work is an automatic CC placement algorithm for IC element arrays. Additionally, the paper presents a method for the CC arrangement evaluation. It allows for evaluating the quality of an array, and a comparison of different placement methods.

: http://publica.fraunhofer.de/dokumente/N-458742.html