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Advantages of coaxial external illumination for monitoring and control of laser materials processing

 
: Regaard, B.; Kaierle, S.; Schulz, W.; Moalem, A.

Ostendorf, A. ; Laser Institute of America -LIA-:
Laser Materials Processing Conference and Laser Microfabrication Conference at ICALEO 2005, 24th International Congress on Applications of Lasers & Electro-Optics. Congress Proceedings. CD-ROM : October 31 - November 3, Hyatt Regency Miami, Miami, Florida, USA
Orlando, Fla.: LIA, 2005 (LIA publication 598)
ISBN: 0-912035-82-X
S.915-919
International Congress on Applications of Lasers and Electro Optics (ICALEO) <24, 2005, Miami/Fla.>
Laser Materials Processing Conference <2005, Miami/Fla.>
Laser Microfabrication Conference <2005, Miami/Fla.>
Englisch
Konferenzbeitrag
Fraunhofer ILT ()

Abstract
Due to high demands on quality assurance and the necessity of permanent documentation of product quality forced by ISO 9000 and in-house regulations, the need for reliable online process control systems increases. State-of-the-art sensor systems for process monitoring analyze electromagnetic radiation out of the process zone. This paper reports on advantages using a different observation method. By an additional diode laser beam coaxial to the working laser the material surface is being illuminated; the reflected light is observed likewise coaxial by a CMOS camera. This setup offers new observation possibilities for research and process control.

: http://publica.fraunhofer.de/dokumente/N-45779.html