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Terahertz time-domain technology for thickness determination of industrial relevant multi-layer coatings

: Ellrich, Frank; Klier, Jens; Weber, Stefan; Jonuscheit, Joachim; Freymann, Georg von


Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-4673-8485-8 (Electronic)
ISBN: 978-1-4673-8486-5 (Print on Demand)
Article 7758614, 2 S.
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <41, 2016, Copenhagen>
Fraunhofer IPM ()
Thickness Measurement; Coatings; Terahertz Spectroscopy; Time-of-Flight-Measurement Principle

Nowadays, aircrafts and cars are coated with several layers of coating. Hence, demands for thickness monitoring of each individual layer within a multi-layer coating system are rising. Industrially established techniques for coating thickness control have limits when analyzing multi-layer systems. Terahertz technology using time-domain spectroscopy with a time-of-flight-measurement principle has shown a great potential to fulfill all the desired requirements. Combining different evaluation algorithms we are able to determine all layer thicknesses from 5 μm to 500 μm with an accuracy down to 1 μm within only one second. We demonstrate this ability at relevant industrial coating systems.