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Self-calibrating approach for terahertz thickness measurements of ceramic coatings

: Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René


Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-4673-8485-8 (Electronic)
ISBN: 978-1-4673-8486-5 (Print on Demand)
Article 775854, 2 S.
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <41, 2016, Copenhagen>
Fraunhofer IPM ()
Thickness Measurement; Ceramics; Terahertz Technique; Refractive Index; Thermal Barrier Coatings

We present a highly accurate self-calibrating approach to investigate ceramic thermal barrier coatings on metallic substrates using terahertz (THz) technique in reflection geometry. The proposed approach enables the simultaneous determination of the complex refractive index and the coating thickness. Hence, a pre-calibration of the specimen under test is not required.