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Material characterization using a compact W-Band ellipsometer

 
: Klenner, M.; Zech, C.; Hülsmann, A.; Kühn, J.; Schlechtweg, M.; Ambacher, O.

European Microwave Association:
46th European Microwave Conference, EuMC 2016. Proceedings : 4-6 October 2016, London, UK, European Microwave Week (EuMW) 2016
London: Horizon House, 2016
ISBN: 978-2-87487-043-9
S.803-806
European Microwave Conference (EuMC) <46, 2016, London>
European Microwave Week (EuMW) <19, 2016, London>
Englisch
Konferenzbeitrag
Fraunhofer IAF ()

Abstract
In this paper, we demonstrate a novel, compact setup for the characterization of homogeneous plastic materials. The method is based on reflection ellipsometry and is adopted to the millimeter wave regime by using horn antennas for linear polarization of the transmitted electromagnetic field. The design of the measurement system and the influence of different setup related parameters on its accuracy are discussed. Finally, the dispersion of the refractive index over the frequency range between 75GHz and 110 GHz is presented and analyzed for different dielectric samples.

: http://publica.fraunhofer.de/dokumente/N-423584.html