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Image processing of light-scattering images for the qualitative surface analysis

: Haar, L.; Anding, K.; Schröder, S.; Hauptvogel, M.; Notni, G.

International Measurement Confederation -IMEKO-, Technical Committee Technical Diagnostics -TC 10-:
14th IMEKO TC10 Workshop on Technical Diagnostics 2016. New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety : Milan, Italy, 27-28 June 2016
Red Hook, NY: Curran, 2016
ISBN: 978-1-5108-2620-5
Workshop on Technical Diagnostics <14, 2016, Milan>
Fraunhofer IOF ()

Light scattering analysis is already used for roughness measurements, but it is also possible to determine defects on surfaces with this method. Therefore, the scattering distribution is recorded and analyzed using image processing. The defects lead to specific characteristics in the images, which can be assigned to them. In this process the segmentation has an important role because only the best possible separation of the error characteristic leads to good results in the further steps of the image processing chain and in the classification process. For this reason, various segmentation methods were applied to two datasets of images of the scattering distributions and their quality was evaluated by means of the obtained recognition rates. © 2016, IMEKO-International Measurement Federation Secretariat.