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A fast rotating scanning approach for millimeter wave imaging

: Nüßler, D.; Brauns, R.; Heinen, S.; Kose, S.; Pohl, N.


45th European Microwave Conference, EuMC 2015. Proceedings : 7-10 September 2015, Paris, France
London: Horizon House, 2015
ISBN: 978-2-8748-7039-2
European Microwave Conference (EuMC) <45, 2015, Paris>
Fraunhofer FHR ()

Millimeter wave imaging technologies offer a wide spectrum of new applications. Research results of the last year's show, that millimeter waves can be used to detect letter bombs and non-metallic impurities inside products or can be used to control material parameters in real-Time applications to detect fluctuations during the production. The main challenge for an operational system is the development of fast and cheap scanner concepts for this frequency range.