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Layout design using neural networks and Markov random fields

 
: Paaß, G.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IJCNN '93. International Joint Conference on Neural Networks. Proceedings
Piscataway/N.J., 1993
ISBN: 0-7803-1421-2
S.782-785
International Joint Conference on Neural Networks <1993, Nagoya>
Englisch
Konferenzbeitrag
Fraunhofer FIT ()
design; uncertain reasoning; neural networks

: http://publica.fraunhofer.de/dokumente/N-41527.html