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2016
Conference Paper
Titel
Integration of GaN HEMTs onto silicon CMOS by micro transfer printing
Abstract
Integration of GaN high voltage transistors into Silicon CMOS could combine superior electrical parameters of GaN HEMTs and the huge logic functionality of Silicon CMOS. Several issues of a monolithic integration of GaN devices into CMOS like material mismatch and thermal budgets can be overcome by heterogeneous integration by micro Transfer Printing. Results of first printing experiments with small GaN on Si HEMTs are presented.
Author(s)