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LNA module reliability testing for the MetOp second generation satellites

 
: Kärkkäinen, M.; Kantanen, M.; Alanne, A.; Viitanen, J.; Jukkala, P.; Rösch, M.; Leuther, A.; Perichaud, M.-G.; Kangas, V.

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Institute of Electrical and Electronics Engineers -IEEE-; European Space Agency -ESA-, Paris:
9th Global Symposium on Millimeter-Waves (GSMM 2016) & 7th ESA Workshop on Millimetre-Wave Technology and Applications : 6-8 June 2016, Espoo, Finland
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-5090-1349-4 (Print)
ISBN: 978-1-5090-1348-7 (Online)
S.182-185
Global Symposium on Millimeter Waves (GSMM) <9, 2016, Espoo>
Workshop on Millimetre-Wave Technology and Applications <7, 2016, Espoo>
Englisch
Konferenzbeitrag
Fraunhofer IAF ()
millimeter wave integrated circuits; MIMIC; MMIC´s; low noise amplifiers; millimeter wave transistors; integrated circuit reliability; reliability engineering

Abstract
The reliability of the equipment that will be used in the MetOp Second Generation satellites is crucial, since there are significant storage and in-operation times. To evaluate the reliability performance of these receivers ESA has set up projects to assess these issues in advance. The most critical parts within the receivers of the atmospheric sounder and imager instruments are identified to be the detectors and the low-noise amplifiers. These components have a dedicated reliability assessment program within the projects on module level and the results can help in evaluating the most critical reliability aspects that should be investigated more carefully. In this paper, the 54 GHz (Vband) and 118 GHz (F-band) low-noise amplifier module design and reliability test results are presented.

: http://publica.fraunhofer.de/dokumente/N-408779.html