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Statistical tests to determine spatial correlations in the response behavior of PUFs

: Willsch, Benjamin; Hauser, Julia; Dreiner, Stefan; Goehlich, Andreas; Vogt, Holger


Institute of Electrical and Electronics Engineers -IEEE-:
12th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2016 : 27th - 30th of June 2016, Lisbon, Portugal
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-5090-0492-8
ISBN: 978-1-5090-0493-5
4 S.
Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) <12, 2016, Lisbon>
Fraunhofer IMS ()
physically unclonable functions; spatial correlation; statistical randomness tests

The level of security provided by physically unclonable functions (PUFs) strongly depends on the unpredictability of its challenge-response behavior. Systematic variation in the properties of a PUF might introduce correlations in the output bits. The mutual dependence of response bits is typically not detected by conventional methods, thus leaving the PUF vulnerable to prediction attacks. New methods accounting for the spatial distribution of response bits are presented, allowing to detect security leaks due to correlation effects at device level. The presented methods are easily applicable to a wide-range of array-based PUFs.