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A traceable method for the arc-free characterization and modeling of CDM-testers and pulse metrology chains

 
: Gieser, H.; Wolf, H.; Soldner, W.; Reichl, H.; Andreini, A.; Natarajan, M.I.; Stadler, W.

IEEE Electron Devices Society:
25th Electrical Overstress/Electrostatic Discharge Symposium 2003. Proceedings : Las Vegas, Nevada, September, 21 - 25, 2003
Rome, NY: ESD Association, 2003
ISBN: 1-585-37057-6
ISBN: 978-1-5853-7057-3
S.328-337
Annual International Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) <25, 2003, Las Vegas/Nev.>
Englisch
Konferenzbeitrag
Fraunhofer IZM ()
ESD; electrostatic discharge; CDM

Abstract
A traceable low-voltage network analysis in the time and frequency domain is introduced for the arcfree characterization of CDM testers and their metrology chains. An improved tester circuit model is derived from step responses.

: http://publica.fraunhofer.de/dokumente/N-39397.html