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Test System Architectures using Advanced Standardized Test Languages

Presentation held at 3rd International Workshop on Software Test Architecture (InSTA 2016), 10. April 2016, Chicago
 
: Rennoch, Axel

:
Präsentation urn:nbn:de:0011-n-3939432 (2.3 MByte PDF)
MD5 Fingerprint: 0287b4372ca97b05fb10a34c589372cc
Erstellt am: 10.6.2016


2016, 57 Folien
International Workshop on Software Test Architecture (InSTA) <3, 2016, Chicago/Ill.>
Englisch
Vortrag, Elektronische Publikation
Fraunhofer FOKUS ()
TTCN-3; UTP; TDL; Test architecture; Test automation

Abstract
The development of test suites using standardized test languages like TTCN-3 and UTP starts with an analysis of the external interfaces towards the system under test (SUT). Large and complex SUTs often require a distributed test system architecture that have to consider the test objectives and the introduction of multiple parallel test system components. The decomposition of a test system needs to be discussed and decided at the very beginning of the test development process. This presentation introduces different approaches from industrial test suite development projects and provides experiences with abstract test system architecture issues (e.g. synchronization, logging and maintenance).

: http://publica.fraunhofer.de/dokumente/N-393943.html