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X-Ray microtomography for materials characterization

 
: Hanke, Randolf; Fuchs, Theobald; Salamon, Michael; Zabler, Simon

Hübschen, Gerhard; Altpeter, Iris; Tschuncky, Ralf; Herrmann, Hans-Georg:
Materials characterization using nondestructive evaluation (NDE) methods
Cambridge: Woodhead Publishing, 2016 (Woodhead publishing series in eletronic and optical materials 88)
ISBN: 978-0-08-100040-3 (Print)
ISBN: 978-0-08-100057-1 (eBook)
S.45-77
Englisch
Aufsatz in Buch
Fraunhofer IZFP ()
Fraunhofer IIS ()
Werkstoffprüfung; Simulation; Röntgentechnik; Röntgenquelle; Röntgendetektor; Rekonstruktion / Algorithmik; Physik; Messsystem; Lebensmittel; industrielle CT; industrielle BV; Gussteile; Defekterkennung; CT-Systeme; CT-Bildqualität; Computer-Tomografie (CT); Computational Imaging; Artefakt; 3D Bildverarbeitung; 3D; 2D

Abstract
Since the 1970ies X-ray Computed Tomography (CT) has become a well-established and routinely used modality in modern diagnostic radiology (Hounsfield, 1973). Beyond that, since the late 1980ies, X-ray CT has emerged as a very important and wide spread tool in industrial inspection as well as in material sciences (Hanke, et al., 2008).

: http://publica.fraunhofer.de/dokumente/N-393864.html