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Characterisation of ultra-narrow band filters for diode laser systems based on dense wavelength division multiplexing

: Rubel, D.; Witte, U.; Hengesbach, S.; Traub, M.; Hoffmann, D.


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Photonics Society, Scottish Chapter; European Photonics Industry Consortium -EPIC-:
IEEE High Power Diode Lasers and Systems Conference, HPD 2015. Proceedings : Co-located with Photonex 2015, 14th and 15th October 2015, Coventry, United Kingdom
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4673-9177-1 (Print)
ISBN: 978-1-4673-9178-8 (Electronic)
ISBN: 978-1-4673-9179-5 (Print on Demand)
High Power Diode Lasers and Systems Conference (HPD) <2015, Coventry>
Fraunhofer ILT ()

We present a measurement platform to characterise combining elements used for dense wavelength division multiplexing, such as dielectric edge filters or Volume Bragg Gratings (notch filters). This platform enables the characterisation of the spectral and angular selectivity, the homogeneity of reflectance or transmittance and temperature-induced spectral shift of the band edge. The determination of the diffraction efficiency, the reflectance and the transmittance is carried out for both polarisations with high accuracy.