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2016
Conference Paper
Titel
Sensing properties of ultra-thin TiO2 nanostructured films based sensors
Abstract
In this work, ultra-thin TiO2 nanostructured films, synthesized by atomic layer deposition method (ALD), were integrated in sensor structures. The effect of post-growth annealing and thickness of TiO2 samples on UV and hydrogen gas sensing properties is investigated. An increase in current value of more than one order of magnitude (I-UVON/I-UVOFF similar to 38) has been detected under exposure to UV light (365 nm) of sample with 45 nm thickness and annealed in furnace at 650 degrees C for 2 hours. Samples with 15 nm thickness and rapid thermal annealed at 450 degrees C for 3 min, have shown hydrogen gas response (similar to 3.75).