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Reliability investigations of FCOB assemblies with process-induced defects
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2000
Conference Paper
Titel
Reliability investigations of FCOB assemblies with process-induced defects
Author(s)
Schubert, K.
Dudek, R.
Klöser, J.
Michel, B.
Reichl, H.
Hauck, T.
Kaskoun, K.
Hauptwerk
International Symposium on Advanced Packaging Materials - Processes, Properties and Interfaces 2000. Proceedings
Konferenz
International Symposium on Advanced Packaging Materials 2000
DOI
10.1109/ISAPM.2000.869242
Language
English
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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM